Title :
Dielectric Properties of Polyimide Film. I. Ac Properties
Author_Institution :
Materials and Engineering Analysis IBM Corporation P.O. Box 6 Endicott, NY 13760
fDate :
4/1/1978 12:00:00 AM
Abstract :
Dielectric properties have been measured, in the frequency range 100 to 100 kHz and in the temperature range -200 to +150°C, for as-received polyimide and for polyimide annealed at 240°C/24 hr. Three loss peaks were found. The structural motions which give rise to these peaks have been determined through a comparison with other data on polyimide, as well as with data on the structurally simi lar polyamides and polyurethanes.
Keywords :
Annealing; Capacitance measurement; Crystallization; Dielectric losses; Dielectric materials; Dielectric measurements; Frequency measurement; Polyimides; Temperature distribution; Temperature measurement;
Journal_Title :
Electrical Insulation, IEEE Transactions on
DOI :
10.1109/TEI.1978.298056
