• DocumentCode
    1067124
  • Title

    Dielectric Properties of Polyimide Film. I. Ac Properties

  • Author

    Sacher, E.

  • Author_Institution
    Materials and Engineering Analysis IBM Corporation P.O. Box 6 Endicott, NY 13760
  • Issue
    2
  • fYear
    1978
  • fDate
    4/1/1978 12:00:00 AM
  • Firstpage
    94
  • Lastpage
    98
  • Abstract
    Dielectric properties have been measured, in the frequency range 100 to 100 kHz and in the temperature range -200 to +150°C, for as-received polyimide and for polyimide annealed at 240°C/24 hr. Three loss peaks were found. The structural motions which give rise to these peaks have been determined through a comparison with other data on polyimide, as well as with data on the structurally simi lar polyamides and polyurethanes.
  • Keywords
    Annealing; Capacitance measurement; Crystallization; Dielectric losses; Dielectric materials; Dielectric measurements; Frequency measurement; Polyimides; Temperature distribution; Temperature measurement;
  • fLanguage
    English
  • Journal_Title
    Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9367
  • Type

    jour

  • DOI
    10.1109/TEI.1978.298056
  • Filename
    4080508