• DocumentCode
    1067270
  • Title

    Breakdown Mechanisms in Sulphur-Hexafluoride

  • Author

    Malik, N.H. ; Qureshi, A.H.

  • Author_Institution
    Electrical Engineering Department, University of Windsor, Windsor, Ontario, Canada N9B 3P4
  • Issue
    3
  • fYear
    1978
  • fDate
    6/1/1978 12:00:00 AM
  • Firstpage
    135
  • Lastpage
    145
  • Abstract
    The well known breakdown theories, Townsend´s generation mechanism and the streamer mechanism, are reviewed and applied to the results of breakdown in the strongly electronegative gas, sulphur-hexafluoride. Experimental results reported in the literature on the breakdown behavior of sulphur-hexafluoride are examined in the light of these theories. The breakdown theories are used for the estimation of the breakdown voltages in pure SF6. Other factors that may affect the breakdown characteristics of SF6 have been discussed. Further areas of work have been proposed in order to obtain a better understanding of the breakdown mechanism.
  • Keywords
    Breakdown voltage; Chemicals; Circuit stability; Dielectric breakdown; Electric breakdown; Electrons; Gases; Insulation; Ionization; Sulfur hexafluoride;
  • fLanguage
    English
  • Journal_Title
    Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9367
  • Type

    jour

  • DOI
    10.1109/TEI.1978.298121
  • Filename
    4080525