DocumentCode
1067403
Title
Simulation of Dynamic Levitation Force Taking Flux Creep Into Account
Author
Kasal, Raphael B. ; De Andrade, Rubens, Jr. ; Sotelo, Guilherme G. ; Ferreira, Antonio C.
Author_Institution
Dept. of Ind. & Technol. Dev., Rio de Janeiro
Volume
17
Issue
2
fYear
2007
fDate
6/1/2007 12:00:00 AM
Firstpage
2158
Lastpage
2161
Abstract
This work compares dynamic levitation force measurements, at different approaching speeds, with levitation force simulations that take flux creep into account. This was done using a power-law electric field current-voltage relationship that can be derived from the Anderson-Kim model. The algorithm for the simulation starts from the analytical expressions of the classical electromagnetic theory to write the integral equation of the time derivative of the current density inside the superconductor, depending on the geometry of the system and the configurations of the applied field. Then, using the Method of Moments, the analytical integral equation was written in its matrix formulation. The current density in each time step is obtained by a simple integral rule (method of Euler). From the current density profile in the superconductor, the levitation force between a permanent magnet and a superconductor, with finite cylindrical geometry, is calculated. The current density profile depends on the approaching speed. The results of the simulations were compared favorably with the experimental measurements.
Keywords
critical current density (superconductivity); flux creep; magnetic levitation; permanent magnets; Anderson-Kim model; critical state model; current density; dynamic levitation force; flux creep; permanent magnet; power-law electric field current-voltage relationship; Analytical models; Creep; Current density; Electrostatic levitation; Force measurement; Geometry; Integral equations; Power system modeling; Solid modeling; Superconducting magnets; Critical state model; dynamic levitation force; flux creep;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/TASC.2007.899054
Filename
4277493
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