Title :
Wetting characteristics of Pb-free solder alloys and PWB finishes
Author :
Sattiraju, S.V. ; Dang, Bing ; Johnson, R. Wayne ; Li, Yali ; Smith, Jeffrey S. ; Bozack, Michael J.
Author_Institution :
NSF Center for Adv. Vehicle Electron., Auburn Univ., AL, USA
fDate :
7/1/2002 12:00:00 AM
Abstract :
For a successful transition to Pb-free manufacturing in electronics assembly, it is critical to understand the behavior of Pb-free solders (in bulk and paste form) and their interaction with the Pb-free printed wiring board (PWB) finishes. This paper presents the results obtained from solder paste spread tests and wetting balance experiments with several Pb-free solder alloys and Pb-free PWB finishes. The solder alloys studied were Sn3.4Ag4.8Bi, Sn4.0Ag0.5Cu, Sn3.5Ag and Sn0.7Cu. Eutectic Sn37Pb was used as a reference. The PWB surface finishes were Sn, NiAu, Ag and OSP. Wetting balance experiments were conducted in air while the spread tests were performed in air and nitrogen to understand the effect of reflow atmosphere on the spreading. Surface analysis techniques such as Nomarski phase contrast microscopy, Auger electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS) were used to characterize the as-received PWB finishes. Sequential electrochemical reduction analysis (SERA) was also performed on the as-received PWB test coupons and on the Sn test coupons after multiple reflow cycles. The effect of multiple reflow cycles on the wetting performance, spreading and the surface composition of the PWB finishes was studied.
Keywords :
Auger electron spectra; X-ray photoelectron spectra; bismuth alloys; copper alloys; corrosion protective coatings; electrochemical analysis; printed circuit manufacture; reflow soldering; silver alloys; tin alloys; wetting; AES; Ag; Ag finish; Auger electron spectroscopy; NiAu; NiAu finish; Nomarski phase contrast microscopy; OSP finish; Pb-free PWB finishes; Pb-free solder alloys; SERA; Sn; Sn finish; Sn0.7Cu; Sn3.4Ag4.8Bi; Sn3.5Ag; Sn4.0Ag0.5Cu; SnAg; SnAgBi; SnAgCu; SnCu; X-ray photoelectron spectroscopy; XPS; electronics assembly; eutectic Sn37Pb reference; multiple reflow cycles; printed wiring board finishes; reflow atmosphere; sequential electrochemical reduction analysis; solder paste spread tests; solderability; spreading; surface analysis techniques; surface composition; wetting balance experiments; wetting characteristics; Assembly; Manufacturing; Nitrogen; Performance evaluation; Sequential analysis; Spectroscopy; Surface finishing; Testing; Tin; Wiring;
Journal_Title :
Electronics Packaging Manufacturing, IEEE Transactions on
DOI :
10.1109/TEPM.2002.801651