• DocumentCode
    1067601
  • Title

    Relative permittivity measurement of thick-film dielectrics at microwave frequencies

  • Author

    Huang, Heng ; Free, C.E. ; Pitt, K.E.G. ; Shorthouse, G.P.

  • Author_Institution
    Sch. of Electron. Eng., Middlesex Univ., London
  • Volume
    31
  • Issue
    21
  • fYear
    1995
  • fDate
    10/12/1995 12:00:00 AM
  • Firstpage
    1812
  • Lastpage
    1814
  • Abstract
    A novel extension of the resonant cavity technique used to measure relative permittivity at microwave frequencies is presented. The new technique is aimed particularly at the measurement of very thin dielectric layers and has been used to measure the permittivity of a thin dielectric layer printed onto a thick substrate whose permittivity is known. Successful experimental data has been obtained for 100 μm thick dielectrics at X-band
  • Keywords
    cavity resonators; microwave measurement; permittivity measurement; thick films; X-band; microwave frequencies; printed layer; relative permittivity measurement; resonant cavity technique; thick-film dielectrics;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • Filename
    475064
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1067601