• DocumentCode
    1067784
  • Title

    Transient temperature behavior in pulsed double-drift IMPATT diodes

  • Author

    Holway, Lowell H., Jr.

  • Author_Institution
    Raytheon Research Division, Waltham, MA
  • Volume
    27
  • Issue
    2
  • fYear
    1980
  • fDate
    2/1/1980 12:00:00 AM
  • Firstpage
    433
  • Lastpage
    442
  • Abstract
    The temperatures in a pulsed double-drift IMPATT diode are calculated as a function of position and time by a finite difference calculation using the alternating direction algorithm. The results are given as a function of pulse length and duty factor for a typical double-drift diode designed to operate near X band. Techniques are described for choosing spatial meshes and time integrals which vary with position and time in a way that minimizes computation time. Numerical results are chosen to illustrate the distribution of temperature within the diode at different times during the pulse, the effect of a temperature-dependent breakdown voltage upon radial temperature distribution, and the interplay between the short thermal-diffusion times within the GaAs diode and the long times associated with the slow heating-up of the heat sink at great distances. An extended definition of thermal resistance for pulsed diodes is introduced and the implications upon reliability are discussed.
  • Keywords
    Computational geometry; Finite difference methods; Heat sinks; Heat transfer; Schottky diodes; Semiconductor diodes; Space heating; Temperature dependence; Temperature distribution; Thermal resistance;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1980.19880
  • Filename
    1480673