Title :
Electrical characteristics of single buried microstrip lines in the TEM approximation
Author :
Prince, John L. ; Santhinathan, R. ; Palusinski, Olgierd A. ; Scheinfein, Michael R.
Author_Institution :
Dept. of Electr. & Comput. Eng., Arizona Univ., Tucson, AZ, USA
Abstract :
Several design parameters for the analysis of the performance of buried microstrip-like interconnect geometries under the assumption of TEM-mode wave propagation are examined. Electrical characteristics of buried microstrip are investigated over a wide range of practical values of material parameters and geometries. The result is a set of curves which can be used for substrate design for a wide range of dielectric constants and for a variety of practical geometries.<>
Keywords :
permittivity; strip lines; TEM approximation; TEM-mode wave propagation; design parameters; dielectric constants; interconnect geometries; single buried microstrip lines; substrate design; Capacitance; Dielectric losses; Dielectric substrates; Electric variables; Geometry; Impedance; Integrated circuit interconnections; Laplace equations; Microstrip; Packaging;
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
