DocumentCode :
1068016
Title :
n-channel MOS transistors in mercury—cadmium—telluride
Author :
Kolodny, Avinoam ; Shacham-Diamand, Yosi J. ; Kidron, I.
Author_Institution :
Technion-Israel Institute of Technology, Haifa, Israel
Volume :
27
Issue :
3
fYear :
1980
fDate :
3/1/1980 12:00:00 AM
Firstpage :
591
Lastpage :
595
Abstract :
n-channel MOS transistors operating at 77 K have been realized in Hg0.71Cd0.29Te with ion-implanted source and drain junctions. Enhancement-mode transistors were made with evaporated ZnS as a gate insulator, and depletion-mode transistors were made using a native oxide of mercury-cadmium-telluride. The devices exhibit surface mobility as high as 1.5 × 104cm2. V-1. s-1. Current-voltage characteristics and capacitance-voltage data are presented and analyzed.
Keywords :
Capacitance-voltage characteristics; Current-voltage characteristics; Electron mobility; Infrared detectors; Insulation; MOSFETs; Mercury (metals); Photonic band gap; Threshold voltage; Zinc compounds;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1980.19904
Filename :
1480697
Link To Document :
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