• DocumentCode
    1068016
  • Title

    n-channel MOS transistors in mercury—cadmium—telluride

  • Author

    Kolodny, Avinoam ; Shacham-Diamand, Yosi J. ; Kidron, I.

  • Author_Institution
    Technion-Israel Institute of Technology, Haifa, Israel
  • Volume
    27
  • Issue
    3
  • fYear
    1980
  • fDate
    3/1/1980 12:00:00 AM
  • Firstpage
    591
  • Lastpage
    595
  • Abstract
    n-channel MOS transistors operating at 77 K have been realized in Hg0.71Cd0.29Te with ion-implanted source and drain junctions. Enhancement-mode transistors were made with evaporated ZnS as a gate insulator, and depletion-mode transistors were made using a native oxide of mercury-cadmium-telluride. The devices exhibit surface mobility as high as 1.5 × 104cm2. V-1. s-1. Current-voltage characteristics and capacitance-voltage data are presented and analyzed.
  • Keywords
    Capacitance-voltage characteristics; Current-voltage characteristics; Electron mobility; Infrared detectors; Insulation; MOSFETs; Mercury (metals); Photonic band gap; Threshold voltage; Zinc compounds;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1980.19904
  • Filename
    1480697