DocumentCode :
1068035
Title :
Computer simulation for the conductance of a contact interface. II
Author :
Nakamura, Mitsunobu ; Minowa, Isao ; Kanno, Makoto
Author_Institution :
Dept. of Electron. Eng., Tamagawa Univ., Tokyo, Japan
Volume :
11
Issue :
3
fYear :
1988
Firstpage :
324
Lastpage :
327
Abstract :
A global model for contact conductance has been previously proposed, and global behavior of contact conductance was studied by computer simulation based on the finite-element method (see ibid., vol.CHMT-9, p.150-5, June 1986). Another global property is studied, using the same model and method as previously described. The contact conductance of a single conducting spot is higher when the spot exists in the center of a contact interface than when the spot is close to the edges or corners. The fact can be only intuitively understood; however, it is not indicated quantitatively. The conductance of a single conducting spot is computed against the location of the spot in a contact interface, and the numerical results are illustrated. It is clearly shown that the edge effect of interface to conductance is small unless a conducting spot closely approaches the edges.<>
Keywords :
digital simulation; electric admittance; electrical contacts; computer simulation; contact conductance; contact interface; edge effect; finite-element method; global model; single conducting spot; Building materials; Computer interfaces; Computer simulation; Concrete; Conducting materials; Conductivity; Contact resistance; Equations; Finite element methods;
fLanguage :
English
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0148-6411
Type :
jour
DOI :
10.1109/33.16660
Filename :
16660
Link To Document :
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