• DocumentCode
    1068163
  • Title

    Broadband sampling oscilloscope characterization with the “Nose-to-Nose” calibration procedure: a theoretical and practical analysis

  • Author

    Verspecht, Jan

  • Author_Institution
    Vrije Univ., Brussels, Belgium
  • Volume
    44
  • Issue
    6
  • fYear
    1995
  • fDate
    12/1/1995 12:00:00 AM
  • Firstpage
    991
  • Lastpage
    997
  • Abstract
    In the past the “nose-to-nose” calibration procedure has been introduced as probably the most accurate method to determine the impulse response of broadband sampling oscilloscopes like the HP54124T. The method is based on the hypothesis “sampler kick-out equals oscilloscope impulse response”. This hypothesis was originally based on an intuitive approach and was later verified experimentally (comparison with power measurements) as well as with SPICE simulations. Until now, however, there was no generalized mathematical evidence supporting this basic hypothesis. In this paper a mathematical theory is developed, which starts from a generalized sampler equivalent scheme, and which shows that, under conditions which are valid in practice, the sampler kick-out indeed equals the sampler impulse response. Experimental results are reported concerning the accuracy and precision of the calibration procedure. These experiments involve the investigation of experiment repeatability, noise, sampler linearity and timebase effects
  • Keywords
    calibration; cathode-ray oscilloscopes; time bases; transient analysis; transient response; broadband sampling oscilloscope; calibration procedure; experiment repeatability; mathematical theory; nose-to-nose calibration procedure; oscilloscope impulse response; sampler equivalent scheme; sampler kick-out; sampler linearity; timebase effects; Calibration; Connectors; Diodes; Linearity; Mathematical model; Oscilloscopes; Pulse circuits; Pulse shaping methods; SPICE; Sampling methods;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.475144
  • Filename
    475144