DocumentCode
1068216
Title
Impurities in silicon solar cells
Author
Davis, John Ransford, Jr. ; Rohatgi, Ajeet ; Hopkins, Richard H. ; Blais, Phillip D. ; Rai-Choudhury, P. ; Mccormick, James R. ; Mollenkopf, H.C.
Author_Institution
Westinghouse Research and Development Center, Pittsburgh, PA
Volume
27
Issue
4
fYear
1980
fDate
4/1/1980 12:00:00 AM
Firstpage
677
Lastpage
687
Abstract
The effects of various metallic impurities, both singly and in combinations, on the performance of silicon solar cells have been studied. Czochralski crystals were grown with controlled additions of secondary impurities. The primary dopants were boron and phosphorus while the secondaires were: A1, B, C, Ca, Co, Cr, Cu, Fe, Mg, Mn, Mo, Nb, P, Pd, Ta, Ti, V, W, Zn, and Zr. Impurity concentrations ranged from 1010to 1017/cm3. Solar cells were made using a conventional diffusion process and were characterized by computer reduction of
data. The collected data indicated that impurity-induced performance loss was primarily due to reduction of the base diffusion length. Based on this observation, an analytic model was developed which predicts cell performance as a function of the secondary impurity concentrations. The calculated performance parameters are in good agreement with measured values except for Cu, Ni, and Fe, which at higher concentrations, degrade the cell substantially by means of junction mechanisms. This behavior can be distinguished from base diffusion length effects by careful analysis of the
data. The effects of impurities in n-base and p-base devices differ in degree but submit to the same modeling analysis. A comparison of calculated and measured performance for multiple impurities indicates a limited interaction between impurities, e.g., copper appears to improve titanium-doped cells.
data. The collected data indicated that impurity-induced performance loss was primarily due to reduction of the base diffusion length. Based on this observation, an analytic model was developed which predicts cell performance as a function of the secondary impurity concentrations. The calculated performance parameters are in good agreement with measured values except for Cu, Ni, and Fe, which at higher concentrations, degrade the cell substantially by means of junction mechanisms. This behavior can be distinguished from base diffusion length effects by careful analysis of the
data. The effects of impurities in n-base and p-base devices differ in degree but submit to the same modeling analysis. A comparison of calculated and measured performance for multiple impurities indicates a limited interaction between impurities, e.g., copper appears to improve titanium-doped cells.Keywords
Boron; Chromium; Copper; Crystals; Impurities; Iron; Niobium; Photovoltaic cells; Silicon; Zinc;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1980.19922
Filename
1480715
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