Projection-based approach to image analysis: pattern recognition and representation in the position-orientation space

Author

Greenspan, Hayit ; Porat, Moshe ; Zeevi, Yehoshua Y.

Author_Institution

Dept. of Electr. Eng., Technion-Israel Inst. of Technol., Haifa, Israel

Volume

14

Issue

11

fYear

1992

fDate

11/1/1992 12:00:00 AM

Firstpage

1105

Lastpage

1110

Abstract

A method for image analysis, based on the formalism of functional analysis is proposed. This approach, which is employed for pattern recognition in the combined position-orientation space, is motivated by a variety of neurophysiological findings that emphasize the importance of the orientation feature in visual image processing and analysis. The approach is applied to the so-called Glass patterns, which are special cases of images characterized uniquely by their orientational feature of local correlations between pairs of corresponding dots. The approach can be of interest in the analysis of optical flow

Keywords

functional analysis; image processing; image recognition; Glass patterns; functional analysis; image analysis; local correlations; optical flow; pattern recognition; position-orientation space; projection based method; Conferences; Feature extraction; Glass; Graphics; Image analysis; Image processing; Image recognition; Machine intelligence; Pattern recognition; Solids;

fLanguage

English

Journal_Title

Pattern Analysis and Machine Intelligence, IEEE Transactions on

Publisher

ieee

ISSN

0162-8828

Type

jour

DOI

10.1109/34.166626

Filename

166626