Title :
Projection-based approach to image analysis: pattern recognition and representation in the position-orientation space
Author :
Greenspan, Hayit ; Porat, Moshe ; Zeevi, Yehoshua Y.
Author_Institution :
Dept. of Electr. Eng., Technion-Israel Inst. of Technol., Haifa, Israel
fDate :
11/1/1992 12:00:00 AM
Abstract :
A method for image analysis, based on the formalism of functional analysis is proposed. This approach, which is employed for pattern recognition in the combined position-orientation space, is motivated by a variety of neurophysiological findings that emphasize the importance of the orientation feature in visual image processing and analysis. The approach is applied to the so-called Glass patterns, which are special cases of images characterized uniquely by their orientational feature of local correlations between pairs of corresponding dots. The approach can be of interest in the analysis of optical flow
Keywords :
functional analysis; image processing; image recognition; Glass patterns; functional analysis; image analysis; local correlations; optical flow; pattern recognition; position-orientation space; projection based method; Conferences; Feature extraction; Glass; Graphics; Image analysis; Image processing; Image recognition; Machine intelligence; Pattern recognition; Solids;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on