• DocumentCode
    1068331
  • Title

    A study of the conversion efficiency limit of p+-i-n+silicon solar cells in concentrated sunlight

  • Author

    Chappell, Terry I.

  • Author_Institution
    IBM Thomas J. Watson Research Center, Yorktown Heights, NY
  • Volume
    27
  • Issue
    4
  • fYear
    1980
  • fDate
    4/1/1980 12:00:00 AM
  • Firstpage
    760
  • Lastpage
    766
  • Abstract
    The conversion efficiency limit of p+-i-n+silicon solar cells in concentrated sunlight is explored with numerical simulations of an idealized p+-i-n+cell having field-induced junctions. Conversion efficiencies greater than 30 percent are calculated for this cell operating in sunlight concentrated 1000 times. The relative importance of bulk and surface recombination in limiting the cell conversion efficiency is illustrated for operation in 1 to 1000 suns. For surface recombination velocities below 100 cm/s, it is shown that bulk recombination losses limit the cell performance rather than recombination losses occurring in the p+or n+regions. The results show that Auger recombination in the bulk region will limit ultimately the cell conversion efficiency.
  • Keywords
    Doping; Numerical simulation; Optical losses; Optical reflection; Performance loss; Photonic band gap; Photovoltaic cells; Silicon; Surface resistance; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1980.19933
  • Filename
    1480726