Title :
Highly accelerated life testing (HALT) for multilayer ceramic capacitor qualification
Author :
Munikoti, Ramachandra ; Dhar, Pulak
Author_Institution :
Northern Telecom Electron. Ltd., Kanata, Ont., Canada
Abstract :
A highly accelerated life-test (HALT) method was employed to life test nearly 20 vendor lots of 50-V rated COG, X7R, and Z5U chip capacitors at 400 V and 140 degrees C stress. Their failure rates were compared with those observed in the standard 1000-h life test at 100 V and 125 degrees C stress. Acceptable correlation was observed between the two methods. In addition to reducing the qualification time from months to a few days, HALT has the capability of ascribing the device failures to manufacturing-process or material defects. It can greatly help users to identify defective lots quickly, determine the mean-time-to-failure of each incoming, lot, and detect major changes in the vendor´s processes.<>
Keywords :
capacitors; failure analysis; life testing; 100 V; 125 degC; 140 degC; 400 V; COG; HALT; X7R; Z5U; chip capacitors; failure rates; highly accelerated life-test; manufacturing-process; material defects; mean-time-to-failure; multilayer ceramic capacitor; qualification time; Capacitors; Ceramics; Life estimation; Life testing; Manufacturing processes; Nonhomogeneous media; Qualifications; Stress; Temperature; Voltage;
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
