Title :
Sub-1-μA dynamic reference voltage generator for battery-operated DRAMs
Author :
Tanaka, Hitoshi ; Nakagome, Yoshinobu ; Etoh, Jun ; Yamasaki, Eiji ; Aoki, Masakazu ; Miyazawa, Kazuyuki
Author_Institution :
Central Res. Labs., Hitachi Ltd., Tokyo, Japan
fDate :
4/1/1994 12:00:00 AM
Abstract :
A new reference voltage generator with ultralow standby current of less than 1 μA is proposed. The features are: 1) a merged scheme of threshold voltage difference generator and voltage-up converter with current mirror circuits, and 2) intermittent activation technique using self-refresh clock for the DRAM. This combination enables the average current to be reduced to 1/100 and the resistance of trimming resistor to be reduced to 1/10 compared to conventional reference voltage generators, while maintaining high accuracy and high stability. The proposed circuit was experimentally evaluated with a test device fabricated using 0.3-μm process. An initial error of less than 4% for 6 trimming steps of the trimming resistor, temperature dependence of less than 370 ppm/°C from room temperature to 100°C, and output noise of less than 12 mV for 1 Vp-p Vcc bumping are achieved. These results are sufficient for achieving high-density battery operated DRAMs with low active and data-retention currents comparable to SRAMs
Keywords :
DRAM chips; power supply circuits; reference circuits; 0.3 micron; 1 muA; 20 to 100 degC; battery-operated DRAMs; current mirror circuits; data-retention currents; dynamic reference voltage generator; high-density DRAMs; intermittent activation technique; merged scheme; output noise; self-refresh clock; temperature dependence; threshold voltage difference generator; trimming resistor; ultralow standby current; voltage-up converter; Circuit noise; Circuit stability; Circuit testing; Clocks; Mirrors; Random access memory; Resistors; Standby generators; Temperature dependence; Threshold voltage;
Journal_Title :
Solid-State Circuits, IEEE Journal of