DocumentCode :
1068535
Title :
A 12-b 600 ks/s digitally self-calibrated pipelined algorithmic ADC
Author :
Lee, Hae-Seung
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., MIT, Cambridge, MA, USA
Volume :
29
Issue :
4
fYear :
1994
fDate :
4/1/1994 12:00:00 AM
Firstpage :
509
Lastpage :
515
Abstract :
This paper discusses fully digital error correction and self-calibration which correct errors due to capacitor mismatch, charge injection, and comparator offsets in algorithmic A/D converters. The calibration is performed without any additional analog circuitry, and the conversion does not need extra clock cycles. This technique can be applied to algorithmic converter configurations including pipelined, cyclic, or pipelined cyclic configurations. To demonstrate the concept, an experimental 2-stage pipelined cyclic A/D converter is implemented in a standard 1.6-μm CMOS process. The ADC operates at 600 ks/s using 45 mW of power at ±2.5 V supplies. The active die area excluding the external logic circuit is 1 mm2. Maximum DNL of ±0.6 LSB and INL of ±1 LSB at a 12-b resolution have been achieved
Keywords :
CMOS integrated circuits; analogue-digital conversion; comparators (circuits); error correction; linear integrated circuits; -2.5 V; 1.6 micron; 2.5 V; 45 mW; CMOS process; DNL; INL; active die area; capacitor mismatch; charge injection; comparator offsets; differential nonlinearity; digital error correction; digitally self-calibrated; integral nonlinearity; pipelined algorithmic ADC; pipelined cyclic configurations; Calibration; Capacitors; Circuits; Clocks; Delay; Error correction; Operational amplifiers; Power amplifiers; Sampling methods; Switches;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.280701
Filename :
280701
Link To Document :
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