• DocumentCode
    1068616
  • Title

    Trapped field analysis in an HTS bulk with a crack using 3D finite element method

  • Author

    Hahn, Seung-yong ; Kim, Sung-Hoon ; Hahn, Song-Yop

  • Author_Institution
    Francis Bitter Magnet Lab., Massachusetts Inst. of Technol., Cambridge, MA, USA
  • Volume
    14
  • Issue
    2
  • fYear
    2004
  • fDate
    6/1/2004 12:00:00 AM
  • Firstpage
    634
  • Lastpage
    637
  • Abstract
    The trapped field variation of a high temperature superconducting (HTS) bulk before and after a crack happens, which was impossible to simulate using 2D analysis method, was calculated in this paper. 3D finite element method (FEM) and iteration method were used to find screening current distribution inside an HTS bulk. In 3D analysis of an HTS bulk with a crack, calculated current distribution inside an HTS bulk should obey the equation of current continuity. For this purpose, ∇φ variable was set to satisfy the equation of current continuity, which was impossible to be considered directly by the FEM governing equation using critical state model. Also, boundary condition at the surface of an HTS bulk was applied to consider the equation of current continuity. Simulation results were compared with experimental ones to verify the validity of the suggested simulation method.
  • Keywords
    cracks; critical current density (superconductivity); current distribution; finite element analysis; high-temperature superconductors; iterative methods; magnetic field effects; superconducting magnets; 3D finite element method; HTS bulk crack; critical state model; current continuity; high temperature superconducting bulk; iteration method; screening current distribution; trapped field analysis; trapped field variation; Bean model; Current density; Current distribution; Energy storage; Finite element methods; High temperature superconductors; Magnetic analysis; Maxwell equations; Superconducting magnets; Temperature distribution; Crack; D finite element method; HTS bulk; iteration method; trapped field analysis;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2004.830008
  • Filename
    1324873