Title :
KTC noise on direct injection from IR diodes
Author :
Buss, Dennis D. ; Kansy, Robert J. ; Barton, J. Brock
Author_Institution :
Texas Instruments, Incorporated, Dallas, TX, USA
fDate :
5/1/1980 12:00:00 AM
Abstract :
When a MOSFET is used to transfer the photogenerated charge from an IR diode to the input of a CCD in the "direct-injection" mode, Johnson-Nyquist noise on the MOSFET transconductance results in a variance in the charge integrated in the CCD which is approximately equal to KTC under the assumption of large diode resistance, where C is the detector capacitance.
Keywords :
Capacitance measurement; Charge coupled devices; Charge measurement; Circuit noise; Current measurement; Diodes; MOSFET circuits; Noise measurement; Transconductance; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1980.19973
