DocumentCode :
1068825
Title :
Super low-noise GaAs MESFET´s with a deep-recess structure
Author :
Ohata, Keiichi ; Itoh, Hitoshi ; Hasegawa, Fumio ; Fujiki, Yoshinori
Author_Institution :
Nippon Electric Company, Ltd., Kawasaki, Japan
Volume :
27
Issue :
6
fYear :
1980
fDate :
6/1/1980 12:00:00 AM
Firstpage :
1029
Lastpage :
1034
Abstract :
Super low-noise GaAs MESFET\´s for replacement of parametric amplifiers have been successfully developed by adopting a deep-recess structure. The structure of a 0.5-µm gate in a deeply recessed region with a cylindrical edge shape has enabled reduction of the source resistance to a half of that of conventional flat-type MESFET\´s. The noise figure was improved by more than 0.5 dB by this reduction of the source resistance, and less than 2.0-dB noise figure has been reproducibly obtained at 12 GHz. The best noise figures were 0.7 dB (14.9-dB gain) at 4 GHz and 1.68 dB (10.7-dB gain) at 12 GHz. The developed MESFET\´s were applied to two-stage amplifiers of 11.7-12.2-GHz band, and the noise figure obtained was 2.16 dB ( T_{e}: 185 K) at room temperature and 1.94 dB ( T_{e}: 163 K) at 0°C. This performance is good enough to replace some of parametic amplifiers.
Keywords :
Gain; Gallium arsenide; Low-noise amplifiers; MESFETs; Noise figure; Satellite communication; Shape; Surface resistance; Tellurium; Temperature;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1980.19982
Filename :
1480775
Link To Document :
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