DocumentCode :
1068977
Title :
The use of GaAs—(Ga, Al)As heterostructures for FET devices
Author :
Boccon-gibod, Dominique ; Andre, Jean-pierre ; Baudet, Pierre ; Hallais, Jean-pierre
Author_Institution :
Laboratoires d´´Electroniques et de Physique Appliquée, Limeil-Brévannes, France
Volume :
27
Issue :
6
fYear :
1980
fDate :
6/1/1980 12:00:00 AM
Firstpage :
1141
Lastpage :
1147
Abstract :
The metalorganic VPE process has been applied to the growth of GaAs-GaAlAs heterostructures suitable for FET devices. Two kinds of materials are examined; namely, insulating GaAlAs hetero-buffer and heterojunction p-GaAlAs-n-GaAs, The technology of device processing uses selective etching and self-alignment techniques. The heterobuffered FET´s demonstrate effective electron confinement and the heterojunction HJFET´s exhibit a built-in voltage of 1.4 eV. However, more has to be known on the transition at the heterointerface to improve the device performances.
Keywords :
Buffer layers; Electrons; Etching; FETs; Gallium arsenide; Heterojunctions; Insulation; MESFETs; Positron emission tomography; Substrates;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1980.19997
Filename :
1480790
Link To Document :
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