Inverse Fourier transform method for characterizing arrayed-waveguide gratings

Author

Lazaro, J.A. ; Wessel, R. ; Koppenborg, J. ; Dudziak, G. ; Blewett, I.J.

Author_Institution

Opt. Fibers & Passive Components, Alcatel Res. & Innovation, Stuttgart, Germany

Volume

15

Issue

1

fYear

2003

Firstpage

93

Lastpage

95

Abstract

A new characterization method of phase and amplitude errors in arrayed-waveguide gratings (AWGs) based on inverse Fourier transformation (IFT) is presented. It overcomes the limitations of previous optical low-coherence methods (OLCs), allowing the characterization of AWGs with any step increment (/spl Delta/L). The method has been successfully used to characterize an AWG with a /spl Delta/L of only 23 μm. A comparison between the results from IFT and OLC methods shows a standard deviation of the phase errors of 2/spl deg/ for an AWG with a /spl Delta/L of 51 μm.

Keywords

Fourier transform optics; Mach-Zehnder interferometers; arrayed waveguide gratings; fibre optic sensors; inverse problems; optical planar waveguides; optical testing; wavelength division multiplexing; WDM; arrayed-waveguide gratings; inverse Fourier transform method; optical low-coherence methods; optical planar waveguides; optical waveguide arrays; phase errors; standard deviation; step increment; wavelength-division multiplexing; Arrayed waveguide gratings; Fourier transforms; Light sources; Optical arrays; Optical interferometry; Optical planar waveguides; Optical waveguides; Phased arrays; Planar waveguides; Wavelength division multiplexing;

fLanguage

English

Journal_Title

Photonics Technology Letters, IEEE

Publisher

ieee

ISSN

1041-1135

Type

jour

DOI

10.1109/LPT.2002.805809

Filename

1159073