Title :
Inverse Fourier transform method for characterizing arrayed-waveguide gratings
Author :
Lazaro, J.A. ; Wessel, R. ; Koppenborg, J. ; Dudziak, G. ; Blewett, I.J.
Author_Institution :
Opt. Fibers & Passive Components, Alcatel Res. & Innovation, Stuttgart, Germany
Abstract :
A new characterization method of phase and amplitude errors in arrayed-waveguide gratings (AWGs) based on inverse Fourier transformation (IFT) is presented. It overcomes the limitations of previous optical low-coherence methods (OLCs), allowing the characterization of AWGs with any step increment (/spl Delta/L). The method has been successfully used to characterize an AWG with a /spl Delta/L of only 23 μm. A comparison between the results from IFT and OLC methods shows a standard deviation of the phase errors of 2/spl deg/ for an AWG with a /spl Delta/L of 51 μm.
Keywords :
Fourier transform optics; Mach-Zehnder interferometers; arrayed waveguide gratings; fibre optic sensors; inverse problems; optical planar waveguides; optical testing; wavelength division multiplexing; WDM; arrayed-waveguide gratings; inverse Fourier transform method; optical low-coherence methods; optical planar waveguides; optical waveguide arrays; phase errors; standard deviation; step increment; wavelength-division multiplexing; Arrayed waveguide gratings; Fourier transforms; Light sources; Optical arrays; Optical interferometry; Optical planar waveguides; Optical waveguides; Phased arrays; Planar waveguides; Wavelength division multiplexing;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2002.805809
