Title :
High Field Conduction and Breakdown in Solid Dielectrics
Author_Institution :
Faculty of Engineering Osaka University Osaka, Japan
fDate :
6/1/1980 12:00:00 AM
Keywords :
Amorphous materials; Breakdown voltage; Charge carrier density; Dielectric breakdown; Dielectrics and electrical insulation; Electrodes; Electron mobility; Electron traps; Solids; Thermal conductivity;
Journal_Title :
Electrical Insulation, IEEE Transactions on
DOI :
10.1109/TEI.1980.298305
