DocumentCode :
1069128
Title :
Insulation Ageing Studies by Chemical Characterization
Author :
Tanaka, John
Author_Institution :
University of Connecticut Storrs, Connecticut
Issue :
3
fYear :
1980
fDate :
6/1/1980 12:00:00 AM
Firstpage :
201
Lastpage :
205
Abstract :
In order to better understand the chemistry of ageing processes, a number of parameters beyond brittleness or end-of-life must be followed. Several techniques which attempt to follow changes at the molecular level are described in addition to the morphological studies using microscopy. Because of the very subtle changes taking place in a solid dielectric at conditions not much more severe than service conditions, attention has been paid to the sensitivity of the methods used. The techniques described along with other more novel techniques must be utilized in order to truly understand thee chemistry of the ageing of solid dielectrics.
Keywords :
Aging; Chemicals; Dielectrics; Insulation; Optical films; Optical microscopy; Optical refraction; Scanning electron microscopy; Solids; Transmission electron microscopy;
fLanguage :
English
Journal_Title :
Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9367
Type :
jour
DOI :
10.1109/TEI.1980.298313
Filename :
4080728
Link To Document :
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