• DocumentCode
    1069128
  • Title

    Insulation Ageing Studies by Chemical Characterization

  • Author

    Tanaka, John

  • Author_Institution
    University of Connecticut Storrs, Connecticut
  • Issue
    3
  • fYear
    1980
  • fDate
    6/1/1980 12:00:00 AM
  • Firstpage
    201
  • Lastpage
    205
  • Abstract
    In order to better understand the chemistry of ageing processes, a number of parameters beyond brittleness or end-of-life must be followed. Several techniques which attempt to follow changes at the molecular level are described in addition to the morphological studies using microscopy. Because of the very subtle changes taking place in a solid dielectric at conditions not much more severe than service conditions, attention has been paid to the sensitivity of the methods used. The techniques described along with other more novel techniques must be utilized in order to truly understand thee chemistry of the ageing of solid dielectrics.
  • Keywords
    Aging; Chemicals; Dielectrics; Insulation; Optical films; Optical microscopy; Optical refraction; Scanning electron microscopy; Solids; Transmission electron microscopy;
  • fLanguage
    English
  • Journal_Title
    Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9367
  • Type

    jour

  • DOI
    10.1109/TEI.1980.298313
  • Filename
    4080728