Title :
Vertical p-n-p for complementary bipolar technology
Author :
Magdo, Ingrid E.
Author_Institution :
IBM Corporation, East Fishkill, NY
fDate :
8/1/1980 12:00:00 AM
Abstract :
A process to fabricate high-performance vertical p-n-p devices has been developed. The use of a high-dose boron-implanted poly-Si layer to form the emitter is essential to obtain shallow emitters with high emitter gradient. The devices exhibit very high current gain (>200) and a calculated cutoff frequency of 3.6 GHz. The process as developed is compatible with the n-p-n process and, thus, suitable for fabrication of complementary bipolar devices.
Keywords :
Annealing; Boron; Circuits; Cutoff frequency; Data systems; Fabrication; Implants; Silicon; Stacking; Substrates;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1980.20046