DocumentCode
1069498
Title
Improving the Voltage Holdoff Performance of Alumina Insulators in Vacuum Through Quasimetallizing
Author
Miller, H. Craig
Author_Institution
General Electric Company Neutron Devices Department P. O. Box 11508 St. Petersburg, Florida 33733
Issue
5
fYear
1980
Firstpage
419
Lastpage
428
Abstract
Treatment of the surface of an alumina insulator with coatings incorporating varying amounts of Cr, Mn, and Ti can increase the vacuum voltage holdoff capability of the insulator significantly (up to 25%). During processing (quasimetallizing) the coating penetrates into the alumina, making it insensitive to mechanical damage. This quasimetallizing treatment is also compatible with subsequent metallizing and brazing of the alumina insulator. A 7/1 Mn/Ti mix performed very well, being found to be as effective on a 94% A12O3 alumina as on the previously investigated 95% A12O3, 1% Cr2O3 alumina. Mixes of 6/1/1 Mn/Ti/Cr and 6/3 Mn/Cr performed about as well as the 7/1 Mn/Ti mix, but no better. Quasimetallizing with pure Mn improved the voltage holdoff capability of alumina by about half as much as when using the 7/1 Mn/Ti mix. Mixes with relatively high titanium content (4/3 Mn/Ti and 3/3/2 Mn/Ti/Cr) significantly increased the voltage holdoff capability of the alumina, but unfortunately were much more prone than the 7/1 Mn/Ti mix (or plain alumina) to suffer severe and permanent damage when a breakdown did occur. Quasimetallizing with appropriate formulations. has been shown to change the surface characteristics of alumina in two ways: (1) it decreases the surface resistivity of the alumina, and (2) it decreases the secondary electron emission yield of the alumina. Each change improves the voltage holdoff characteristics of the alumina.
Keywords
Chromium; Coatings; Dielectrics and electrical insulation; Electron emission; Flashover; Gas insulation; Surface charging; Surface discharges; Vacuum breakdown; Voltage;
fLanguage
English
Journal_Title
Electrical Insulation, IEEE Transactions on
Publisher
ieee
ISSN
0018-9367
Type
jour
DOI
10.1109/TEI.1980.298336
Filename
4080768
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