DocumentCode
1069504
Title
Application of homing sequences to synchronous sequential circuit testing
Author
Pomeranz, Irith ; Reddy, Sudhakar M.
Author_Institution
Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
Volume
43
Issue
5
fYear
1994
fDate
5/1/1994 12:00:00 AM
Firstpage
569
Lastpage
580
Abstract
A test generation procedure for synchronous sequential circuits is proposed, that is based on the multiple observation times approach, and uses homing sequences, instead of conventionally used synchronizing sequences, to initialize the circuit. A procedure for computing homing sequences in sequential circuits, for which a state-table description is too large to be practical, is described, and experimental results are presented to demonstrate the effectiveness of the proposed test generation procedure
Keywords
logic testing; sequential circuits; detectable faults; homing sequences; multiple observation times; sequential circuits; synchronous sequential circuit testing; test generation; Circuit faults; Circuit testing; Cities and towns; Electrical fault detection; Fault detection; Notice of Violation; Sequential analysis; Sequential circuits; Synchronous generators;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/12.280804
Filename
280804
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