DocumentCode :
1069722
Title :
Microstructure and Jc-B performance of DRHQ processed Nb3Al tape with Ag stabilizer
Author :
Kikuchi, A. ; Iijima, Y. ; Banno, N. ; Takeuchi, T. ; Inoue, K. ; Nimori, S. ; Kosuge, M. ; Yuyama, M.
Author_Institution :
Nat. Inst. for Mater. Sci., Ibaraki, Japan
Volume :
14
Issue :
2
fYear :
2004
fDate :
6/1/2004 12:00:00 AM
Firstpage :
1008
Lastpage :
1011
Abstract :
The DRHQ process was applied to the jelly-rolled Nb3Al precursors having internal Ag stabilizers. The Ag internal stabilizer is effective to improve the superconducting stability of the DRHQ processed conductor with the Ag-stabilizer/non-Ag ratio of 0.32. The DRHQ process needs a reduction of a bending strain of the precursors, such as tape-formed specimen. The maximum Tc and Bc2(4.2 K) of the DRHQ-processed tape with Ag stabilizer are 18.4 K and 29.7 T, respectively. Large transport core-Jc(4.2 K) of 210 A/mm2 was obtained at high magnetic field of 25 T, which is 20 times larger than that of the typical RHQT-processed wires. On the other hand, Jc in fields below 20 T apparently decreased with increasing the peak heating temperature during the second-RHQ. According to the TEM observation, the stacking faults were still formed in the DRHQ-processed Nb3Al, but their density becomes very small compared with that of the RHQT-processed Nb3Al. In addition, the stacking faults gradually vanished with increasing the peak heating temperature. The grain size of several hundred nanometers for the DRHQNb3Al is still rather small. Thus, these results support that the stacking faults should be dominant as the effective pinning center for the both of RHQT- and DRHQ-processed Nb3Al conductors.
Keywords :
aluminium alloys; critical current density (superconductivity); grain size; niobium alloys; quenching (thermal); rapid thermal processing; silver; stacking faults; superconducting critical field; superconducting tapes; superconducting transition temperature; transmission electron microscopy; type II superconductors; 18.4 K; 25 T; 29.7 T; 4.2 K; Ag; Ag stabilizer; Bc2; DRHQ-processed conductor; DRHQ-processed tape; Jc-B performance; Nb3Al; Nb3Al conductor; RHQT-processed wires; TEM microstructure; bending strain; grain size; heating temperature; internally stabilized precursor; jelly-rolled precursors; magnetic field; pinning center; stacking faults; superconducting stability; Capacitive sensors; Conductors; Heating; Magnetic cores; Microstructure; Niobium; Stability; Stacking; Superconducting films; Temperature; $ Al conductor; $B_c2$; $J_c$; $T_c$; Ag internal-stabilized precursor; DRHQ process; Nb$_; TEM microstructure; pinning center; stacking fault;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2004.830368
Filename :
1324964
Link To Document :
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