Title :
A 1-µm Mo—poly 64-kbit MOS RAM
Author :
Yanagawa, Fumihiko ; Kiuchi, Kazuhide ; Hosoya, Tetsuo ; Tsuchiya, Toshiaki ; Amazawa, Takao ; Mano, Tsuneo
Author_Institution :
Nippon Telegraph and Telephone Public Corporation, Tokyo, Japan
fDate :
8/1/1980 12:00:00 AM
Abstract :
This paper describes a 1-µm 64-kbit MOS RAM using Mopoly technology. New 1-µm double-gate technology using molybdenum and polysilicon (Mo-poly technology) is proposed. In this technology, molybdenum and polysilicon are used for word lines and storage capacitor electrodes in the memory cell, respectively. Therefore, the propagation delay in a word line becomes extremely small and memory cell size is reduced. New two step annealing was developed for stabilizing an Mo-gate MOS structure. Design is optimized for 1-µm Si-gate FET´s in peripheral circuitry. A 1-µm Mo-poly 64-kbit MOS RAM was experimentally fabricated by using 1-µm process technologies. The cell size and die size were 8 µm × 8 µm and 3 mm µ 3 mm, respectively. Access time was less than 100 ns.
Keywords :
Aluminum; Circuits; Electrodes; FETs; Helium; MOS devices; Propagation delay; Random access memory; Read-write memory; Sheet materials;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1980.20077