• DocumentCode
    1069891
  • Title

    High-speed MOS gate array

  • Author

    Nakaya, Masao ; Tomisawa, Osamu ; Ohkura, Isao ; Nakano, Takao

  • Author_Institution
    Mitsubishi Electric Corporation, Itami, Hyogo, Japan
  • Volume
    27
  • Issue
    8
  • fYear
    1980
  • fDate
    8/1/1980 12:00:00 AM
  • Firstpage
    1665
  • Lastpage
    1670
  • Abstract
    The dimensions of the fundamental gate cell were analyzed in the gate-array type masterslice LSI which utilized the DSA MOS process combined with two-level metallization technology. It was revealed that the optimum gate width was 80 µm in the 4-µm design rule, taking the total power dissipation of 3 W and the delay time below 2 ns into consideration. The delay times were measured from both the original design chip and the 80-percent linearly shrunk chips. In the shrunk chip operated at a 3-V lower supply, the average gate delay time of 1.5 ns was obtained at a lower dissipation of 1.2 mW/gate which gave three times better performance than the original design chip at 5-V power supply.
  • Keywords
    Capacitance; Delay effects; Driver circuits; Integrated circuit interconnections; Large scale integration; Logic; Metallization; Power dissipation; Power supplies; Threshold voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1980.20085
  • Filename
    1480878