Title :
A CMOS Image Sensor With In-Pixel Two-Stage Charge Transfer for Fluorescence Lifetime Imaging
Author :
Yoon, Hyung-June ; Itoh, Shinya ; Kawahito, Shoji
Author_Institution :
Grad. Sch. of Electron. Sci. & Technol., Shizuoka Univ., Hamamatsu
Abstract :
A CMOS image sensor for time-resolved fluorescence lifetime imaging with subnanosecond time resolution is presented. In order to analyze the fluorescence lifetime, the proposed CMOS image sensor has two charge transfer stages using a pinned photodiode structure in which the first charge transfer stage is for the time-resolved sifting of fluorescence in all the pixels simultaneously and the second charge transfer stage is for reading the signals in each pixel sequentially with correlated double sampling operation. A 0.18-mum CMOS image sensor technology with a pinned photodiode process option is used for the implementation of a 256 times 256 CMOS image sensor. The decaying images and lifetimes of fura-2 solutions having different concentrations are successfully measured with a 250-ps time step using the CMOS image sensor and ultraviolet laser diode as a light source.
Keywords :
CMOS image sensors; fluorescence; photodiodes; time resolved spectra; CMOS image sensor; charge transfer; fluorescence lifetime imaging; in-pixel two-stage charge transfer; pinned photodiode structure; second charge transfer stage; size 0.18 mum; subnanosecond time resolution; time 250 ps; ultraviolet laser diode; CMOS image sensors; Charge transfer; Fluorescence; Image analysis; Image resolution; Image sampling; Photodiodes; Pixel; Signal analysis; Signal sampling; CMOS image sensor; fluorescence lifetime imaging; time-resolved image; two charge transfer stages;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2008.2011678