DocumentCode
1070090
Title
The use of Fick´s law in modeling diffusion processes
Author
Lowney, Jeremiah R. ; Larrabee, Robert D.
Author_Institution
National Bureau of Standards, Washington, DC
Volume
27
Issue
9
fYear
1980
fDate
9/1/1980 12:00:00 AM
Firstpage
1795
Lastpage
1798
Abstract
Fick´s Law treats the diffusion coefficient as the factor of proportionality between the flux and the spatial gradient of a diffusing species. A recent model for impurity diffusion in semiconductors computes the flux in a different way by taking the spatial gradient of the product of the diffusion coefficient and the density of diffusing species. The results of these two approaches are different for spatially dependent diffusion coefficients. The nature and significance of this difference are explored in terms of the random walk and thermodynamic derivations of the diffusion equation. It is concluded that Fick´s Law is the more fundamental and straightforward way to model diffusion processes
Keywords
Chemicals; Diffusion processes; Electron devices; Equations; Fabrication; Isobaric; NIST; Semiconductor impurities; Thermal force; Thermodynamics;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1980.20105
Filename
1480898
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