• DocumentCode
    1070090
  • Title

    The use of Fick´s law in modeling diffusion processes

  • Author

    Lowney, Jeremiah R. ; Larrabee, Robert D.

  • Author_Institution
    National Bureau of Standards, Washington, DC
  • Volume
    27
  • Issue
    9
  • fYear
    1980
  • fDate
    9/1/1980 12:00:00 AM
  • Firstpage
    1795
  • Lastpage
    1798
  • Abstract
    Fick´s Law treats the diffusion coefficient as the factor of proportionality between the flux and the spatial gradient of a diffusing species. A recent model for impurity diffusion in semiconductors computes the flux in a different way by taking the spatial gradient of the product of the diffusion coefficient and the density of diffusing species. The results of these two approaches are different for spatially dependent diffusion coefficients. The nature and significance of this difference are explored in terms of the random walk and thermodynamic derivations of the diffusion equation. It is concluded that Fick´s Law is the more fundamental and straightforward way to model diffusion processes
  • Keywords
    Chemicals; Diffusion processes; Electron devices; Equations; Fabrication; Isobaric; NIST; Semiconductor impurities; Thermal force; Thermodynamics;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1980.20105
  • Filename
    1480898