DocumentCode :
1070090
Title :
The use of Fick´s law in modeling diffusion processes
Author :
Lowney, Jeremiah R. ; Larrabee, Robert D.
Author_Institution :
National Bureau of Standards, Washington, DC
Volume :
27
Issue :
9
fYear :
1980
fDate :
9/1/1980 12:00:00 AM
Firstpage :
1795
Lastpage :
1798
Abstract :
Fick´s Law treats the diffusion coefficient as the factor of proportionality between the flux and the spatial gradient of a diffusing species. A recent model for impurity diffusion in semiconductors computes the flux in a different way by taking the spatial gradient of the product of the diffusion coefficient and the density of diffusing species. The results of these two approaches are different for spatially dependent diffusion coefficients. The nature and significance of this difference are explored in terms of the random walk and thermodynamic derivations of the diffusion equation. It is concluded that Fick´s Law is the more fundamental and straightforward way to model diffusion processes
Keywords :
Chemicals; Diffusion processes; Electron devices; Equations; Fabrication; Isobaric; NIST; Semiconductor impurities; Thermal force; Thermodynamics;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1980.20105
Filename :
1480898
Link To Document :
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