DocumentCode :
1070151
Title :
Evaluation of gassing materials in switching devices using monochromatic high speed imaging technique
Author :
Zhou, Xin
Author_Institution :
Innovation Center, Eaton Corp., Milwaukee, WI, USA
Volume :
25
Issue :
3
fYear :
2002
fDate :
9/1/2002 12:00:00 AM
Firstpage :
384
Lastpage :
389
Abstract :
The purpose of this paper is to investigate quantitative information on perspective gassing materials to be used in switching devices. Previous work indicates that gassing materials have a strong effect on current interruption and current limiting in these devices. However, few papers have been published to cover quantitative information on the amount of certain gassing species released, such as hydrogen, when the gassing material is exposed to a running arc. Monochromatic high speed imaging technique was employed in this investigation to characterize hydrogen gassing properties of different materials based on hydrogen arc images and nitrogen arc images, respectively. Hydrogen plasma has a very high thermal conductivity that results in high arc voltages during interruption, which is critical to current limiting. Comparison among perspective gassing materials was made. The mass loss results derived from plasma emission intensities showed good agreement with direct mass loss measurements of gassing materials.
Keywords :
circuit-breaking arcs; current limiters; electric strength; high-speed optical techniques; interrupters; current interruption; current limiting; gassing materials; monochromatic high speed imaging technique; quantitative information; running arc; switching devices; thermal conductivity; Conducting materials; Current limiters; Hydrogen; Loss measurement; Nitrogen; Plasma materials processing; Plasma measurements; Plasma properties; Thermal conductivity; Voltage;
fLanguage :
English
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3331
Type :
jour
DOI :
10.1109/TCAPT.2002.804614
Filename :
1159171
Link To Document :
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