• DocumentCode
    1070151
  • Title

    Evaluation of gassing materials in switching devices using monochromatic high speed imaging technique

  • Author

    Zhou, Xin

  • Author_Institution
    Innovation Center, Eaton Corp., Milwaukee, WI, USA
  • Volume
    25
  • Issue
    3
  • fYear
    2002
  • fDate
    9/1/2002 12:00:00 AM
  • Firstpage
    384
  • Lastpage
    389
  • Abstract
    The purpose of this paper is to investigate quantitative information on perspective gassing materials to be used in switching devices. Previous work indicates that gassing materials have a strong effect on current interruption and current limiting in these devices. However, few papers have been published to cover quantitative information on the amount of certain gassing species released, such as hydrogen, when the gassing material is exposed to a running arc. Monochromatic high speed imaging technique was employed in this investigation to characterize hydrogen gassing properties of different materials based on hydrogen arc images and nitrogen arc images, respectively. Hydrogen plasma has a very high thermal conductivity that results in high arc voltages during interruption, which is critical to current limiting. Comparison among perspective gassing materials was made. The mass loss results derived from plasma emission intensities showed good agreement with direct mass loss measurements of gassing materials.
  • Keywords
    circuit-breaking arcs; current limiters; electric strength; high-speed optical techniques; interrupters; current interruption; current limiting; gassing materials; monochromatic high speed imaging technique; quantitative information; running arc; switching devices; thermal conductivity; Conducting materials; Current limiters; Hydrogen; Loss measurement; Nitrogen; Plasma materials processing; Plasma measurements; Plasma properties; Thermal conductivity; Voltage;
  • fLanguage
    English
  • Journal_Title
    Components and Packaging Technologies, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3331
  • Type

    jour

  • DOI
    10.1109/TCAPT.2002.804614
  • Filename
    1159171