DocumentCode :
1070180
Title :
Dielectric recovery characteristics of a high current arcing gap
Author :
Shea, John J.
Author_Institution :
Cutler-Hammer Inc., Eaton Corp., Pittsburgh, PA, USA
Volume :
25
Issue :
3
fYear :
2002
fDate :
9/1/2002 12:00:00 AM
Firstpage :
402
Lastpage :
408
Abstract :
Measurements of the dielectric breakdown strength of an arcing gap after current zero were made to determine the effects of arc chamber venting on the reverse recovery voltage needed to breakdown a recovering gap. The recovery conditions applied closely matched those created in a molded case circuit breaker under power line fault conditions. Three different vent sizes were used to determine the effect of gas pressure on the recovery characteristics of the plasma with recovery time between 170 μs to 280 μs, and currents from 3 kAp to 15 kAp. Larger venting, providing increased cooling of the plasma, resulted in increased breakdown strength over the full range of currents. Based on the approximation that the recovering plasma breakdown strength is inversely proportional to plasma thermal temperature, breakdown voltage values were fitted to an exponential model to obtain plasma time constants and the initial holdoff voltage. Comparing these results to curve fits of E/p values showed E/p was a more accurate representation of the data. It is proposed to use E/p values when there is significant post current-zero chamber pressure. These results could be used as a guide to predicting molded case breaker interruption performance, especially for small arc chambers and short gaps.
Keywords :
circuit breakers; circuit-breaking arcs; electric strength; 170 to 280 mus; 3 to 15 kA; arc chamber venting; breakdown strength; dielectric recovery characteristics; gas pressure; high current arcing gap; initial holdoff voltage; molded case circuit breaker; plasma thermal temperature; plasma time constants; power line fault conditions; recovery characteristics; recovery time; reverse recovery voltage; vent sizes; Breakdown voltage; Circuit breakers; Circuit faults; Cooling; Current measurement; Dielectric breakdown; Dielectric measurements; Plasma properties; Plasma temperature; Vents;
fLanguage :
English
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3331
Type :
jour
DOI :
10.1109/TCAPT.2002.804603
Filename :
1159174
Link To Document :
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