DocumentCode :
1070288
Title :
Memory-cell design in Josephson technology
Author :
Zappe, Hans H.
Author_Institution :
IBM Thomas J. Watson Research Center, Yorktown Heights, NY
Volume :
27
Issue :
10
fYear :
1980
fDate :
10/1/1980 12:00:00 AM
Firstpage :
1870
Lastpage :
1882
Abstract :
Operating principles and criteria for the design of Josephson memory cells are reviewed and the evolution of cell design is retraced to highlight the various constraints imposed by the requirement for high speed, density, large Operating margins, and ease of auxiliary memory circuit design. Two attractive cells have emerged so far. One is a nondestructive readout (NDRO) ring cell for a subnanosecond cache memory chip; the other a destructive readout (DRO) single-flux quantum cell for main memory applications. Both are presently being used as the basis for ongoing design work.
Keywords :
Cache memory; Capacitors; Circuit synthesis; Delay; Helium; Inductors; Magnetic flux; Packaging; Power dissipation; Switches;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1980.20124
Filename :
1480917
Link To Document :
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