DocumentCode
1070369
Title
The micromagnetics of defects in film stacks with interlayer exchange coupling
Author
van den Berg, H.A.M. ; Schmeusser, S.
Author_Institution
Siemens AG, Erlangen, Germany
Volume
29
Issue
6
fYear
1993
fDate
11/1/1993 12:00:00 AM
Firstpage
3099
Lastpage
3101
Abstract
The impact of defects in trilayers comprising two ferromagnetic layers, being mutually exchange coupled via a nonferromagnetic layer, are theoretically studied on the basis of a numerical model. The defect region is characterized by deviations in the uniaxial and cubic anisotropy, in the interlayer coupling, bulk exchange constants and/or saturation magnetization. The model is two-dimensional and employs the Ritz method to evaluate the four walls that are bounding the defect. Three irreversible processes are distinguished at which the splitting up of the above edge walls is most striking. Hysteresis curves of stacks with both cubic and uniaxial anisotropy are shown. The implications of the defects for giant magnetoresistive signals are given, at which the change in the overall hysteresis loop and in the magnetization distribution near the defect is distinguished
Keywords
crystal defects; exchange interactions (electron); ferromagnetic properties of substances; magnetic anisotropy; magnetic hysteresis; magnetic multilayers; magnetic thin films; magnetoresistance; Ritz method; bulk exchange constants; cubic anisotropy; defect region; edge walls; ferromagnetic layers; film stacks; giant magnetoresistive signals; hysteresis curves; interlayer exchange coupling; irreversible processes; magnetization distribution; micromagnetics; model; nonferromagnetic layer; numerical model; overall hysteresis loop; saturation magnetization; trilayers; two-dimensional; uniaxial anisotropy; Couplings; Giant magnetoresistance; Magnetic anisotropy; Magnetic films; Magnetic hysteresis; Magnetic sensors; Magnetic separation; Micromagnetics; Perpendicular magnetic anisotropy; Saturation magnetization;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.280887
Filename
280887
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