• DocumentCode
    1070433
  • Title

    Timing Jitter Measurement in Single-Flux-Quantum Circuits Based on Time-to-Digital Converters With High Time-Resolution

  • Author

    Terabe, Masayoshi ; Sekiya, Akito ; Yamada, Takahiro ; Fujimaki, Akira

  • Author_Institution
    Nagoya Univ., Nagoya
  • Volume
    17
  • Issue
    2
  • fYear
    2007
  • fDate
    6/1/2007 12:00:00 AM
  • Firstpage
    552
  • Lastpage
    555
  • Abstract
    We evaluated timing jitter based on a time-to-digital converter (TDC) having sub-pico seconds time resolution. The measured jitter at liquid helium temperature was 65 fs for an optimally damped simple junction composing a conventional Josephson transmission line fabricated with the NEC standard process. The temperature dependence and shunt resistance dependence of jitter indicate that the jitter originates from thermal noise generated at the shunt resistor of the junction. We also found that the timing jitter of a balanced comparator is much larger than that of a JTL. The jitter of a balanced comparator is independent of temperature. This means that the jitter of a balanced comparator does not arise from thermal noise.
  • Keywords
    analogue-digital conversion; circuit noise; comparators (circuits); convertors; digital integrated circuits; quantum computing; superconducting integrated circuits; superconducting transmission lines; thermal noise; timing jitter; Josephson transmission line; balanced comparator; liquid helium temperature; shunt resistance; shunt resistor; simple junction; single-flux-quantum circuits; thermal noise; time 65 fs; time-to-digital converter; timing jitter measurement; Distributed parameter circuits; Electrical resistance measurement; Helium; Measurement standards; National electric code; Noise generators; Temperature dependence; Thermal resistance; Timing jitter; Transmission line measurements; Flux qubit; time-to-digital converter; timing jitter;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2007.898560
  • Filename
    4277758