DocumentCode
1070433
Title
Timing Jitter Measurement in Single-Flux-Quantum Circuits Based on Time-to-Digital Converters With High Time-Resolution
Author
Terabe, Masayoshi ; Sekiya, Akito ; Yamada, Takahiro ; Fujimaki, Akira
Author_Institution
Nagoya Univ., Nagoya
Volume
17
Issue
2
fYear
2007
fDate
6/1/2007 12:00:00 AM
Firstpage
552
Lastpage
555
Abstract
We evaluated timing jitter based on a time-to-digital converter (TDC) having sub-pico seconds time resolution. The measured jitter at liquid helium temperature was 65 fs for an optimally damped simple junction composing a conventional Josephson transmission line fabricated with the NEC standard process. The temperature dependence and shunt resistance dependence of jitter indicate that the jitter originates from thermal noise generated at the shunt resistor of the junction. We also found that the timing jitter of a balanced comparator is much larger than that of a JTL. The jitter of a balanced comparator is independent of temperature. This means that the jitter of a balanced comparator does not arise from thermal noise.
Keywords
analogue-digital conversion; circuit noise; comparators (circuits); convertors; digital integrated circuits; quantum computing; superconducting integrated circuits; superconducting transmission lines; thermal noise; timing jitter; Josephson transmission line; balanced comparator; liquid helium temperature; shunt resistance; shunt resistor; simple junction; single-flux-quantum circuits; thermal noise; time 65 fs; time-to-digital converter; timing jitter measurement; Distributed parameter circuits; Electrical resistance measurement; Helium; Measurement standards; National electric code; Noise generators; Temperature dependence; Thermal resistance; Timing jitter; Transmission line measurements; Flux qubit; time-to-digital converter; timing jitter;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/TASC.2007.898560
Filename
4277758
Link To Document