Title :
Shear-wave magnetometry
Author :
Squire, P.T. ; Gibbs, M.R.J.
Author_Institution :
Sch. of Phys., Bath Univ., UK
fDate :
3/1/1988 12:00:00 AM
Abstract :
A method of measuring low magnetic fields based on the magnetoelastic effect in amorphous magnetic materials is described. Preliminary results indicate a sensitivity of order 2.5 nT in the frequency range 0-1.6 Hz. The potential sensitivity is estimated to be better than 1 pT. This performance is not particularly impressive, but it has been obtained with as-received material in which the elastic modulus change with applied field is quite small. The phase change for a 1 A/m field change is about 1 degrees , so the field noise observed corresponds to a phase noise of about 2*10-3 degrees, or 35 mu rad.
Keywords :
magnetic field measurement; magnetic properties of amorphous substances; magnetoelastic effects; magnetometers; 0 to 1.6 Hz; amorphous magnetic materials; applied field; elastic modulus change; field noise; magnetoelastic effect; phase change; phase noise; sensitivity; shear wave magnetometry; Amorphous magnetic materials; Amorphous materials; Frequency estimation; Magnetic field measurement; Magnetic fields; Magnetic materials; Magnetometers; Phase change materials; Phase noise; Transducers;
Journal_Title :
Magnetics, IEEE Transactions on