Title :
A simplified two-dimensional numerical analysis of MOS devices—DC case
Author :
Oh, Soo-Young ; Dutton, Robert W.
Author_Institution :
Stanford University, Stanford, CA
fDate :
11/1/1980 12:00:00 AM
Abstract :
A simplified two-dimensional numerical analysis program has been developed for MOS devices. The calculation speed of this program is an order of magnitude faster than that of the finite-difference or finite-element methods due to the reduced number of analysis node points. The method solves only a one-dimensional current-continuity equation along the channel. Poisson´s equation in two dimensions is replaced by an initial solution and a boundary-value problem formulation for the incremental potential and charge. In this method, the nodes are allocated only along the boundaries and the channel; therefore, it has a much smaller number of nodes than that required for other methods. MOS characteristics are simulated and compared with results from the finite-difference program [2], [9]. The agreement is satisfactory within 10 percent over a wide range of the substrate doping concentrations and channel lengths.
Keywords :
Boundary conditions; Central Processing Unit; Charge carrier processes; Doping; Finite difference methods; Finite element methods; MOS devices; MOSFET circuits; Numerical analysis; Poisson equations;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1980.20156