DocumentCode :
1070690
Title :
A CMOS delay locked loop and sub-nanosecond time-to-digital converter chip
Author :
Santos, Dinis M. ; Dow, Scott F. ; Flasck, Jeremy M. ; Levi, Michael E.
Author_Institution :
Aveiro Univ., Portugal
Volume :
43
Issue :
3
fYear :
1996
fDate :
6/1/1996 12:00:00 AM
Firstpage :
1717
Lastpage :
1719
Abstract :
Phase-locked loops have been employed in the past to obtain sub-nanosecond time resolution in high energy physics and nuclear science applications. An alternative solution based on a delay-locked loop (DLL) is described. This solution allows for a very high level of integration yet still offers resolution in the sub-nanosecond regime. Two variations on this solution are outlined. A novel phase detector, based on the Muller C-element, is used to implement a charge pump where the injected charge approaches zero as the loop approaches lock on the leading edge of an input clock reference. This greatly reduces timing jitter. In the second variation the loop locks to both the leading and trailing clock edges. In this second implementation, software coded layout generators are used to automatically layout a highly integrated, multichannel, time-to-digital converter (TDC) targeted for one specific frequency. The two circuits, DLL and TDC, are implemented in CMOS 1.21 μm and 0.8 μm technologies, respectively. Test results show a timing jitter of less than 30 ps for the DLL circuit and less than 190 ps integral and differential non-linearity for the TDC circuit
Keywords :
CMOS digital integrated circuits; analogue-digital conversion; circuit feedback; delay circuits; detector circuits; jitter; nuclear electronics; timing circuits; 0.8 micron; 1.2 micron; 190 ps; 30 ps; CMOS delay locked loop; Muller C-element; charge pump; detector circuits; differential nonlinearity; feedback scheme; integral nonlinearity; latching scheme; multichannel converter; phase detector; software coded layout generators; sub-nanosecond time resolution; tapped delay chain; time-to-digital converter chip; timing jitter reduction; very high level of integration; Charge pumps; Circuit testing; Clocks; Delay; Detectors; Energy resolution; Nuclear and plasma sciences; Phase detection; Phase locked loops; Timing jitter;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.507177
Filename :
507177
Link To Document :
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