DocumentCode :
1070718
Title :
Comparative potential performance of Si, GaAs, GaInAs, InAs submicrometer-gate FET´s
Author :
Cappy, A. ; Carnez, B. ; Fauquembergues, R. ; Salmer, G. ; Constant, E.
Author_Institution :
Université de Lille, Villeneuve D´´Ascq Cedex, France
Volume :
27
Issue :
11
fYear :
1980
fDate :
11/1/1980 12:00:00 AM
Firstpage :
2158
Lastpage :
2160
Abstract :
For very-short-gate FET\´s, the nonstationary electron dynamic effects greatly improve the device performance. By means of a simple self-consistent model which takes into account the transient transport effects, a comparison between the frequency behavior of various semiconductor materials is presented. It is shown that the dynamic properties for a given material are ameliorated for greater values of the product \\mu_{0} \\Delta \\epsilon_{\\Gamma L} . Thus Ga0.47In0.53As and InAs are shown to exhibit quite interesting dynamic operating properties.
Keywords :
Electrons; FETs; Gallium arsenide; Indium phosphide; MESFETs; Monte Carlo methods; Predictive models; Radio frequency; Scattering; Semiconductor materials;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1980.20166
Filename :
1480959
Link To Document :
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