Title :
MP-A5 Design considerations for submicrometer buried-channel MOSFET´s
fDate :
11/1/1980 12:00:00 AM
Keywords :
Doping; Driver circuits; Electron mobility; Inverters; MOS devices; MOSFETs; Scattering; Semiconductor process modeling; Velocity measurement; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1980.20179
