Title :
Microstructure and giant magnetoresistance in Co/Ag films
Author :
Tsoukatos, A. ; Wan, H. ; Hadjipanayis, G.C. ; Lawless, K.R.
Author_Institution :
Dept. of Phys. & Astron., Delaware Univ., Newark, DE, USA
fDate :
11/1/1993 12:00:00 AM
Abstract :
Giant magnetoresistance values are observed in Co/Ag composite films. The largest change in magnetoresistance values is measured in the as-deposited Ag-rich samples with maxima on the order of 30%, at 30 K. X-ray diffraction and electron microscope studies indicate a uniform FCC structure with an apparent composition dependent lattice parameter. High resolution electron micrographs provide the first evidence of Co clustering in an Ag matrix via the observation of the lattice spacing which clearly corresponds to the (200) line of FCC Co. It is believed that the GMR is due to interfacial scattering from these clusters
Keywords :
X-ray diffraction examination of materials; cobalt alloys; crystal microstructure; electron microscope examination of materials; interface structure; lattice constants; magnetic thin films; magnetoresistance; nanostructured materials; silver alloys; 5 to 295 K; Co-Ag; Co-Ag films; Co28Ag72; Co33Ag67; DC susceptibility; HREM; X-ray diffraction; clustering; composite films; composition dependent lattice parameter; electron microscope studies; giant magnetoresistance; interfacial scattering; magnetic moments; microstructure; uniform FCC structure; Crystal microstructure; Electron microscopy; Giant magnetoresistance; Lattices; Magnetic films; Magnetic properties; Magnetic separation; Sputtering; X-ray diffraction; X-ray scattering;
Journal_Title :
Magnetics, IEEE Transactions on
