DocumentCode :
1071124
Title :
Study of LR-Loading Technique for Low-Power Single Flux Quantum Circuits
Author :
Yamanashi, Yuki ; Nishigai, Takanobu ; Yoshikawa, Nobuyuki
Author_Institution :
Yokohama Nat. Univ., Yokohama
Volume :
17
Issue :
2
fYear :
2007
fDate :
6/1/2007 12:00:00 AM
Firstpage :
150
Lastpage :
153
Abstract :
A single-flux-quantum (SFQ) circuit is thought to be very suitable as a peripheral circuit for superconducting quantum bits (qubits), which can manipulate and detect the qubit state at a temperature state similar to qubits. Even though the power consumption of SFQ circuits is extremely small, it is still sufficient to heat the substrate at a temperature below 1 K. We have investigated and demonstrated low-power SFQ circuits for this application, using the LR-loading technique, which can reduce the static power consumption of the SFQ circuits. Simulation results show that the ratio of the switching speed to the time constant of the bias circuit is important for the stable operation of low-power SFQ circuits. The static power consumption of SFQ circuits can be reduced to the same order as the dynamic power consumption through optimization of the circuit parameters. We have designed and tested a low-power SFQ clock generator using the LR-loading technique and confirmed its stable operation at 4.2 K, where the power consumption is reduced by 93% compared with ordinary biased circuits.
Keywords :
superconducting devices; LR-loading technique; SFQ clock generator; bias circuit; peripheral circuit; qubit state; single flux quantum circuits; superconducting quantum bits; temperature 4.2 K; Application software; Circuit testing; Energy consumption; Josephson junctions; Quantum computing; Superconducting device noise; Superconducting devices; Superconducting integrated circuits; Superconducting logic circuits; Temperature; Josephson logic; SFQ circuit; quantum bit; superconducting devices; superconducting integrated circuits;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2007.898608
Filename :
4277820
Link To Document :
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