• DocumentCode
    1071568
  • Title

    Finite element modelling of electrostatic fields in process tomography capacitive electrode systems for flow response evaluation

  • Author

    Khan, S.H. ; Abdullah, F.

  • Author_Institution
    Dept. of Electr., Electron. & Inf. Eng., City Univ., London, UK
  • Volume
    29
  • Issue
    6
  • fYear
    1993
  • fDate
    11/1/1993 12:00:00 AM
  • Firstpage
    2437
  • Lastpage
    2440
  • Abstract
    Various aspects and results of 2-D finite element (FE) modeling of electrostatic fields in 12-electrode capacitive systems for two-phase flow imaging are described. The capacitive technique relies on changes in capacitances between electrodes (mounted on the outer surface of the flow pipe) due to the change in permittivities of flow components. The measured capacitances between various electrode pairs and the field computation data are used to reconstruct the cross sectional image of the flow components. FE modeling of the electric field is necessary to optimize design variables and evaluate the system response to various flow regimes, likely to be encountered in practice. Results are presented in terms of normalized capacitances for various flow regimes. The effects of key geometric parameters of the electrode system are presented and analyzed
  • Keywords
    capacitance measurement; computerised tomography; electric fields; electrodes; finite element analysis; flow measurement; flow visualisation; two-phase flow; 12-electrode capacitive systems; 2D finite element modelling; electrical capacitive tomography; electrostatic fields; flow response evaluation; image quality; normalized capacitances; process tomography capacitive electrode systems; two-phase flow imaging; Capacitance measurement; Data flow computing; Design optimization; Electrodes; Electrostatic measurements; Finite element methods; Fluid flow measurement; Image reconstruction; Permittivity measurement; Surface reconstruction;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.280991
  • Filename
    280991