DocumentCode
1071813
Title
On Voltage Acceleration Models of Time to Breakdown—Part I: Experimental and Analysis Methodologies
Author
Wu, Ernest Y. ; Sune, Jordi
Author_Institution
Technol. Reliability Dept., IBM Microelectron. Div., Essex Junction, VT
Volume
56
Issue
7
fYear
2009
fDate
7/1/2009 12:00:00 AM
Firstpage
1433
Lastpage
1441
Abstract
We propose and outline three independent experimental methodologies applicable to the investigation of voltage acceleration models of time to breakdown (T BD) for dielectric breakdown. The self-consistence requirement of voltage acceleration models and Poisson random statistics in terms of area scaling is discussed in detail. Three different T BD acceleration models, which are T BD exponential law (E model), T BD power law, and T BD exponential law of reciprocal voltage and field (1/V model or 1/E model), as widely discussed in literature, are evaluated in the context of these new methodologies. We have found that the T BD exponential law of reciprocal voltage (1/V model) is the best description for the T BD voltage acceleration in the Fowler-Nordheim tunneling regime while the T BD power-law model is the most appropriate in the direct tunneling regime.
Keywords
Poisson distribution; electric breakdown; reliability; tunnelling; Fowler-Nordheim tunneling; Poisson random statistics; area scaling; dielectric breakdown; exponential law; reliability projection; self-consistence requirement; voltage acceleration models; Acceleration; Breakdown voltage; Context modeling; Dielectric breakdown; Dielectric measurements; Low voltage; Reproducibility of results; Statistics; Stress measurement; Tunneling; Dielectric breakdown; reliability projection; voltage acceleration models;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2009.2021721
Filename
5072256
Link To Document