• DocumentCode
    1071813
  • Title

    On Voltage Acceleration Models of Time to Breakdown—Part I: Experimental and Analysis Methodologies

  • Author

    Wu, Ernest Y. ; Sune, Jordi

  • Author_Institution
    Technol. Reliability Dept., IBM Microelectron. Div., Essex Junction, VT
  • Volume
    56
  • Issue
    7
  • fYear
    2009
  • fDate
    7/1/2009 12:00:00 AM
  • Firstpage
    1433
  • Lastpage
    1441
  • Abstract
    We propose and outline three independent experimental methodologies applicable to the investigation of voltage acceleration models of time to breakdown (T BD) for dielectric breakdown. The self-consistence requirement of voltage acceleration models and Poisson random statistics in terms of area scaling is discussed in detail. Three different T BD acceleration models, which are T BD exponential law (E model), T BD power law, and T BD exponential law of reciprocal voltage and field (1/V model or 1/E model), as widely discussed in literature, are evaluated in the context of these new methodologies. We have found that the T BD exponential law of reciprocal voltage (1/V model) is the best description for the T BD voltage acceleration in the Fowler-Nordheim tunneling regime while the T BD power-law model is the most appropriate in the direct tunneling regime.
  • Keywords
    Poisson distribution; electric breakdown; reliability; tunnelling; Fowler-Nordheim tunneling; Poisson random statistics; area scaling; dielectric breakdown; exponential law; reliability projection; self-consistence requirement; voltage acceleration models; Acceleration; Breakdown voltage; Context modeling; Dielectric breakdown; Dielectric measurements; Low voltage; Reproducibility of results; Statistics; Stress measurement; Tunneling; Dielectric breakdown; reliability projection; voltage acceleration models;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2009.2021721
  • Filename
    5072256