• DocumentCode
    1071986
  • Title

    Investigation of microplasmas in InP avalanche photodiodes

  • Author

    Capasso, F. ; Petroff, P.M. ; Bonner, W.B. ; Sumski, S.

  • Author_Institution
    Bell Laboratories, Murray Hill, NJ
  • Volume
    1
  • Issue
    3
  • fYear
    1980
  • fDate
    3/1/1980 12:00:00 AM
  • Firstpage
    27
  • Lastpage
    29
  • Abstract
    The electron beam induced current technique has been used to investigate microplasmas in InP avalanche photodiodes. It is shown that microplasmas develop along growth induced doping striations. Slope discontinuities in the I-V characteristic have been correlated to the turn on voltage of microplasmas.
  • Keywords
    Avalanche photodiodes; Breakdown voltage; Current measurement; Diodes; Impurities; Indium phosphide; Iron; Leakage current; Low voltage; Testing;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1980.25218
  • Filename
    1481080
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1071986