• DocumentCode
    1072165
  • Title

    CMOS Charge Pump With Transfer Blocking Technique for No Reversion Loss and Relaxed Clock Timing Restriction

  • Author

    Kim, Joung-Yeal ; Jun, Young-Hyun ; Kong, Bai-Sun

  • Author_Institution
    Sch. of Inf. & Commun. Eng., Sungkyunkwan Univ., Suwon
  • Volume
    56
  • Issue
    1
  • fYear
    2009
  • Firstpage
    11
  • Lastpage
    15
  • Abstract
    A CMOS charge pump based on a transfer blocking technique and a modified precharge scheme is proposed for avoiding reversion loss and relaxing the timing restrictions imposed on input clocks. Comparison results in an 80-nm CMOS process indicate that, with no loading current, the output voltage of the proposed charge pump reaches almost 98% of the ideal boosting level with switching ripple reduced by up to 97%. They also indicate that output voltage deviations due to temperature and process variations are reduced by 24%-98% and 81%-95%, respectively.
  • Keywords
    CMOS integrated circuits; charge pump circuits; timing; CMOS charge pump; boosting level; no reversion loss; relaxed clock timing restriction; size 80 nm; switching ripple; transfer blocking technique; voltage doubler; voltage generator; Boosting; CMOS process; Charge pumps; Charge transfer; Clocks; Diodes; MOSFETs; Temperature; Threshold voltage; Timing; Blocking technique; charge pump; voltage doubler; voltage generator;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems II: Express Briefs, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-7747
  • Type

    jour

  • DOI
    10.1109/TCSII.2008.2008521
  • Filename
    4753686