Title :
Diagnosis by Image Recovery: Finding Mixed Multiple Timing Faults in a Scan Chain
Author :
Tzeng, Chao-Wen ; Huang, Shi-Yu
Author_Institution :
National Tsing-Hua Univ., Hsinchu
Abstract :
In this brief, we present a robust new paradigm for diagnosing a scan chain with multiple faults that could have different fault types. As compared to previous methods, the major advantage of ours is the ability to not only target mixed multiple types of timing faults in the same scan chain but also tolerate non-ideal conditions, e.g., when these faults only manifest themselves intermittently. Unlike the previous matching-based algorithms, we formulate the diagnosis problem as an image recovery process featuring a dynamic windowing technique and a running sequence handling technique. Experimental results on a number of real designs show that this paradigm can successfully deal with some situations beyond existing methods.
Keywords :
fault diagnosis; integrated circuit testing; logic testing; timing; dynamic windowing technique; image recovery; matching-based algorithms; mixed multiple timing faults; running sequence handling technique; scan chain diagnosis; Chaos; Circuit faults; Circuit testing; Fault diagnosis; Power generation; Robustness; Routing; Software testing; Test pattern generators; Timing; Fault diagnosis; scan chain;
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
DOI :
10.1109/TCSII.2007.896939