• DocumentCode
    1072503
  • Title

    Resistance associated with FET gate metallization

  • Author

    Granlund, J.

  • Author_Institution
    National Radio Astronomy Observatory, Charlottesville, VA
  • Volume
    1
  • Issue
    8
  • fYear
    1980
  • fDate
    8/1/1980 12:00:00 AM
  • Firstpage
    151
  • Lastpage
    153
  • Abstract
    The resistance of the metallization of a FET gate stripe has the effect of placing a non-linear resistance R(I) in series with the gate junction. A simple means of calculating R(I) is developed, and a curve of the drop across R(1) at milliampere forward biases is given.
  • Keywords
    Convergence; Current measurement; Diodes; Electrical resistance measurement; Equations; FETs; Iterative algorithms; Metallization; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1980.25269
  • Filename
    1481131
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1072503