Magnetostriction measurement by interferometry

Author

Bellesis, George H. ; Harlee, P.S. ; Renema, Andrew, II ; Lambeth, David N.

Author_Institution

Carnegie Mellon Univ., Pittsburgh, PA, USA

Volume

29

Issue

6

fYear

1993

fDate

11/1/1993 12:00:00 AM

Firstpage

2989

Lastpage

2991

Abstract

A laser Doppler interferometric method using synchronous detection to measure the magnetostriction of soft magnetic films is described. The instrument measures 2 Å magnetostrictive deflections of Permalloy films on 500 μm silicon substrates. Saturation magnetostriction of 10 ^-9 can be measured for 1000 nm films on 100 μm Si substrates. The ultimate resolution of the interferometer is 0.1 Å as demonstrated using piezoelectrically-driven mirrors

Keywords

Permalloy; ferromagnetic properties of substances; light interferometry; magnetic thin films; magnetic variables measurement; magnetostriction; measurement by laser beam; strain measurement; 100 micron; 1000 nm; 500 micron; FeNi; Permalloy films; Si substrate; laser Doppler interferometric method; magnetostrictive deflections; piezoelectrically-driven mirrors; resolution; saturation magnetostriction; soft magnetic films; synchronous detection; Instruments; Interferometry; Magnetic films; Magnetostriction; Mirrors; Piezoelectric films; Saturation magnetization; Semiconductor films; Silicon; Soft magnetic materials;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.281096

Filename

281096