Title :
Magnetostriction measurement by interferometry
Author :
Bellesis, George H. ; Harlee, P.S. ; Renema, Andrew, II ; Lambeth, David N.
Author_Institution :
Carnegie Mellon Univ., Pittsburgh, PA, USA
fDate :
11/1/1993 12:00:00 AM
Abstract :
A laser Doppler interferometric method using synchronous detection to measure the magnetostriction of soft magnetic films is described. The instrument measures 2 Å magnetostrictive deflections of Permalloy films on 500 μm silicon substrates. Saturation magnetostriction of 10 -9 can be measured for 1000 nm films on 100 μm Si substrates. The ultimate resolution of the interferometer is 0.1 Å as demonstrated using piezoelectrically-driven mirrors
Keywords :
Permalloy; ferromagnetic properties of substances; light interferometry; magnetic thin films; magnetic variables measurement; magnetostriction; measurement by laser beam; strain measurement; 100 micron; 1000 nm; 500 micron; FeNi; Permalloy films; Si substrate; laser Doppler interferometric method; magnetostrictive deflections; piezoelectrically-driven mirrors; resolution; saturation magnetostriction; soft magnetic films; synchronous detection; Instruments; Interferometry; Magnetic films; Magnetostriction; Mirrors; Piezoelectric films; Saturation magnetization; Semiconductor films; Silicon; Soft magnetic materials;
Journal_Title :
Magnetics, IEEE Transactions on
